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Contact AFM

Advanced Atomic Force Operation

Rev. D Dimension 3100 Manual 125

8.1.10 Engage

1. Select Motor > Engage. A pre-engage check begins, followed by Z-stage motor motion.

2. To move to another area of the sample, execute a Withdraw command to avoid damaging

the tip and scanner.

3. Move the stage using the trackball to the next area of interest on the sample.

4. Select Motor > Engage.

Note: After the tip engages, adjust the control panel values to provide the desired scan

parameters.

8.2 Advanced Atomic Force Operation

Although a great deal can be accomplished with basic knowledge of AFM operation, there is far

more to operating the AFM.

Cantilever selection is critical and becomes more important as tip and cantilever technology

continues to develop. A clear understanding of the parameters in the Realtime control panel allows

the user to tune the microscope to accommodate a wide variety of samples. This section provides

more detailed information on the operation of the Dimension microscope in Contact Mode AFM.

8.2.1 Cantilever Selection

Two basic cantilever styles are available for Contact Mode AFM. Traditional triangular silicon

nitride cantilevers have been used successfully for years. They are robust and relatively

inexpensive. Etched silicon cantilevers with integral tips provide another scanning option. They

have a higher aspect ratio and smaller end radius than the silicon nitride cantilevers (Model ESP).

Note: There are a wide variety of tips available for Contact Mode AFM. Check the tip

buying guide on the Veeco website (www.veeco.com) for more information.

Silicon Nitride Cantilevers

Silicon nitride cantilevers for the Dimension 3100 SPM are available in two process variations:

standard and sharpened. Sharpened silicon nitride cantilevers (Model DNPS) are almost identical in

appearance to the standard silicon nitride cantilevers, but have a slightly sharper end at the very tip.

Sharpened silicon nitride cantilevers are available by mail order through www.veeco.com.

Each silicon nitride cantilever substrate includes four cantilever tips with different size and spring-

constants. Two of the cantilevers on each substrate measure 115µm from the substrate to the apex of

the triangular cantilever (referred to as 100µm cantilevers) while the remaining two cantilevers

measure 193µm from the substrate to the apex of the triangular cantilever (referred to as 200µm

cantilevers). Both cantilever lengths are available with wide legs and narrow legs; however,

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